The effect of spot defects on the parametric yield of long interconnection lines
نویسندگان
چکیده
The effect of non-catastrophic (or soft) defects (i.e., neither short nor open) on long interconnection lines e’s analyzed and an estimate is derived for the frequencydependent critical area for such lines. The analysis is based on a transmission-line model of interconnection lines, and the reflections caused by the defect are taken into account. This analysis results in an estimated prediction of the parametric yield, and a practical recommendation for a better jog insertion in VLSI routing.
منابع مشابه
The E ect of Spot Defects on the Parametric Yield ofLong
The eeect of non-catastrophic (or soft) defects (i.e., neither short nor open) on long interconnection lines is analyzed and an estimate is derived for the frequency-dependent critical area for such lines. The analysis is based on a transmission-line model of interconnection lines, and the reeections caused by the defect are taken into account. This analysis results in an estimated prediction o...
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